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research/EXPERIMENT_PROTOCOL_V1.md sha256=f0c5c62efbb57fa05e52786f814595b2a2812249cfa5a7ffff584f15e1ba793b; research/CALIBRATION_PIPELINE_V1.md sha256=25c0dc3642478b41936306c7dbbef9a0fb80f4f08e705d116325acf1eb17d194 +
git commit 038c9cd00c25fc83678d4d698f8780bfc5d96369; scripts/pivot_calibration/common.py::pipeline_code_sha256 +
B200-2 tmux pane pivot_b200_generation_20260717_a01 on 2026-07-17 +
git commit fd7f9bdb5817c497996b6c44c233010a743cdb74 +
b200-2-generation-20260717-a01 decision.json and qwen/generation.log +
b200-2-generation-20260717-a02 decision.json and qwen/generation.log +
Wentong Li et al., "PMR: Proactive Memory Reclamation for Mobile Devices", USENIX ATC 2025. +
Wentong Li et al., "PMR: Fast Application Response via Parallel Memory Reclaim on Mobile Devices", USENIX ATC 2025. +
PMR: Fast Application Response via Parallel Memory Reclaim on Mobile Devices. USENIX ATC 2025. +
POD-Attention: Unlocking Full Prefill-Decode Overlap for Faster LLM Inference. ASPLOS 2025. +
Aditya K. Kamath et al., "POD-Attention: Unlocking Full Prefill-Decode Overlap for Faster LLM Inference", ASPLOS 2025. +
Aditya K. Kamath et al., "POD-Attention: Unlocking Full Prefill-Decode Overlap for Faster LLM Inference", ASPLOS 2025. +
Evgeny Manzhosov et al., "Polymorphic Error Correction", MICRO 2024. +
Polymorphic Error Correction. MICRO 2024. +
Evgeny Manzhosov et al., "Polymorphic Error Correction", MICRO 2024. +
Jeonghwan Choi, Sriram Govindan, Jinkyu Jeong, Bhuvan Urgaonkar, and Anand Sivasubramaniam, "Power Consumption Prediction and Power-Aware Packing in Consolidated Environments," IEEE Transactions on Computer, vol. 59, no. 12, pp. 1640-1654, Dec. 2010 +
Jeonghwan Choi, Sriram Govindan, Jinkyu Jeong, Bhuvan Urgaonkar, and Anand Sivasubramaniam, "Power Consumption Prediction and Power-Aware Packing in Consolidated Environments" IEEE Transactions on Computer, vol. 59, no. 12, pp. 1640-1654, Dec. 2010 +
Predicting Future-System Reliability with a Component-Level DRAM Fault Model. MICRO 2023. +
Jeageun Jung et al., "Predicting Future-System Reliability with a Component-Level DRAM Fault Model", MICRO 2023. +
Jeageun Jung et al., "Predicting Future-System Reliability with a Component-Level DRAM Fault Model", MICRO 2023. +